Abstract

This investigation is undertaken to determine the reliability of PVC-graphite thick film resistors by determining the potential failure mechanism and the mean time - to - failure. Different drift functions are described for PVC-graphite thick film resistors with different PVC-graphite compositions. The values of the functional parameters depend strongly on the storage test temperature. The mean-to-failure of the PVC-graphite thick film resistors are calculated using Pranchov's model for reliability prediction of thick film resistors.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.