Abstract
The effects of drawing speed, cell size and grain size on the yield strength of nickel 200 wires drawn at room temperature up to a true strain of 2.09 have been investigated. The wire drawing speeds in the range from 17 to 140 mm s−1 do not show any effect on the yield strength, cell size and grain size of drawn wires. However, the cell sizes as well as grain sizes decrease with increase in true wire drawing strain when their values are averaged over all the wire drawing speeds at a given strain. Even though the Hall-Petch equation is valid for all the grain diameters observed in this study, the graph suggests that two distinct linear regimes may be more appropriate to properly describe the strengthening mechanisms during wire drawing. The cell diameter has been correlated with the yield strengths of drawn wires by an inverse relationship.
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