Structure of Amorphous Ge–S System by X-Ray Diffraction

Abstract

An X-ray diffraction study has been carried out for characterizing the structure of the amorphous germanium-sulphur system. An essential feature of the total structural functions, structure factors and pair distribution functions is unchanged in the region between 40 and 15 at.% Ge. It is also found that their number densities are linearly increased on going from 40 to 15 at.% Ge and the number density of crystalline GeS 2 is considerably larger than that of amorphous GeS 2 in which there involve many vacant sites. The partial structural functions of a i j ( q ) and g i j ( r ) have also been estimated from measured total structural data using an assumption of their concentration independence. A possible model was proposed for explaining the short range ordering in amorphous Ge–S.