Abstract
Thin films of cadmium sulfide have been deposited on glass substrates and the structural properties of films have been investigated using scanning electron microscopy and X-ray diffraction techniques. The films consist of domains (groups of grains) and weakly bound grain clusters. The structural parameters of grains, domains and clusters and the effect of film thickness on these parameters are reported. From the measurement of lattice constants in CdS films and in free CdS clusters, it has become evident that the films on glass substrates have a tensile strain along their planes. The effect of thermal annealing on the partial relaxation of the strain is discussed.
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