Structural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray Diffraction

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVNoteStructural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray DiffractionJeffrey T. Culp, Mark Davidson, Randolph S. Duran, and Daniel R. TalhamView Author Information Department of Chemistry, P.O. Box 117200, and Department of Materials Science and Engineering, P.O. Box 116500, University of Florida, Gainesville, Florida 32611 Cite this: Langmuir 2002, 18, 21, 8260–8262Publication Date (Web):September 14, 2002Publication History Received7 June 2002Revised30 July 2002Published online14 September 2002Published inissue 1 October 2002https://doi.org/10.1021/la026046iCopyright © 2002 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views157Altmetric-Citations2LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit Read OnlinePDF (69 KB) Get e-AlertsSUBJECTS:Lattices,Organophosphorus compounds,Physical and chemical processes,Thin films,Transition metals Get e-Alerts