Abstract

Amorphous TiO2 thin films and TiO2/ZnFe2O4 composite films were deposited by r.f. magnetron sputtering. The influence of post-deposition annealing on the structural and optical properties was studied. It was established that the anatase single phase exists between 250 and 800°C for the TiO2 thin films, and between 450 and 650°C for the composite films. The absorption edge of TiO2 thin films and composite films exhibits a blue shift with decreasing annealing temperature. The absorption edge of composite films has moved to visible spectrum range, and a very large red shift occurs in comparison with TiO2 thin films.

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