Abstract
Ag Co multilayers were prepared on various substrates (Si, polyimide and glass) by e-beam evaporation under ultra high vacuum. X-ray diffraction and high resolution electron microscopy studies showed a deterioration of multilayer structure upon reducing the individual Co-layer thickness to 0.5 nm. Furthermore, the saturation field in the parallel field geometry increases, as SQUID magnetometry revealed, while magnetoresistance reaches 16% at room temperature and exceeds 30% at 30 K. Magnetoresistance values were found to depend strongly on individual layer thicknesses as well as on the total film thickness.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
