Abstract
We studied the structural and electrical properties of SrRuO₃ thin films grown on SrTiO₃ (110) substrate. High resolution X-ray diffraction measurement of the grown film showed 1) very sharp peaks for SrRuO₃ film with a very narrow rocking curve with FWHM = 0.045° and 2) coherent growth behavior having the same in-plane lattice constants of the film as those of the substrate. The resisitivity data showed good metallic behavior; ρ = 63 (205) μΩㆍ㎝ at 5 (300) K with a residual resistivity ratio of ~3. The observed kink at ρ(T) showed that the ferromagnetic transition temperature was ~10 K higher than that of SrRuO₃ thin film grown on SrTiO₃ (001) substrate. The observed rather lower RRR value could be partially due to a very small amount of Ru vacancy generally observed in SrRuO₃ thin films grown by PLD method and is evident in the larger unit-cell volume compared to that of stoichiometric thin film.
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