Abstract
High-Tc superconducting epitaxial thin films of GdBa2Cu3O7-x, (GBCO), grown in situ by DC magnetron sputtering onto substrates of single-crystal (001) oriented LaAlO3, SrTiO3 and yttrium-stabilized ZrO2, have been studied by high resolution double crystal X-ray diffractometry, X-ray white beam Laue topography and scanning electron microscopy. The lattice mismatch between film and substrate in the (001) direction was determined to be 3.0% for the film on the LaAlO3 substrate, while the mismatch in the (110) direction was estimated to be 2.9% from extremely asymmetric X-ray rocking curves exploiting the tunability of synchrotron radiation. The data show that the unit cell of the GBCO film is greater than that of bulk GBCO materials, implying that the film is totally relaxed. It is proven that when grown on an yttrium-stabilized ZrO2 substrate the a and b axes of the unit cell of the film are rotated by 45 degrees with respect to the a axis of the substrate. Scanning electron microscopy observations reveal that there are many micrograins less than one micron in size on the surface of the films, confirming the results of double-crystal topography.
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