Abstract
This paper presents a strategy for achieving metrological traceability using vector network analyzers (VNAs) at submillimeter-wave frequencies (300–3000 GHz). The strategy includes the use of traceable calibration techniques designed for operation at these frequencies. Slight, but significant, physical differences between the waveguide line standards, used during calibration, are accommodated by applying a weighting technique to combine results using different calibration lines. Measurement uncertainty is assessed by analyzing replicate measurement data, to take account of the different waveguide interface interactions that occur when the line standards are connected to the VNA. The strategy is illustrated using measurements made in the WM-250 (750–1100 GHz) waveguide band.
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