Abstract
The anisotropic strain of bismuth zinc niobate (BZN) cubic pyrochlore thin films deposited on Si, sapphire, MgO, and Vycor glass substrates is characterized through four circle X-ray diffraction and Raman spectroscopy. Based on the X-ray measurements, it is found that all the films exhibit a hydrostatic compressive strain component with those on MgO substrate exhibiting the highest compressive strain component (0.4%). The effect of the compressive state on the local environment for the ions was investigated through Raman spectroscopy. The observed shifts in the peak position for Raman-active modes are consistent with the measured strain states and correlate well with previously reported dielectric properties for BZN films on MgO, Si, and sapphire.
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