Abstract
The unbroken need of nanoscale characterisation methods for ferroelectric and ferroelastic materials unambiguously points towards the use and implementation of scanning probe instruments (SPM). This article clearly summarises the actual possibilities of addressing scanning force microscopy (SFM) in order to measure distinct surface properties like the surface chemical constitution, the surface polarisation making up the internal and external electric field, the 3-dimensional polarisation distribution, the switching properties, etc. We point out which method is best suited in order to unambiguously record the desired property. Then future trends in nanoscale surface and bulk inspection with SPM are formulated.
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