Abstract
The ultraviolet (UV) induced photovoltaic (PV) module power degradation is researched though the statistics of qualification test results based on IEC 61215:2005. The power degradation rate after UV preconditioning tests is found satisfying the Weibull distribution and the related parameters are calculated under different UV radiation doses. Then, the evolution regularity of degradation rate distribution is modeled by fitting the parameters with acceleration models and the probability density distribution of UV-induced degradation rate is predicted with consideration of the propagated uncertainty. The result tells that 95.0% $ \pm $ 4.045% polysilicon PV modules degrading no more than 8% after 3000 kWh/m2 UV exposure and the distribution of degradation rate under high UV dose tend to concentrate round the maximum probability point. As the temperature in our calculation is fixed at 60 °C which is higher than the actual outdoor operation temperature, the UV-induced degradation rate is expected to be lower after 25-year exposure.
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