Abstract
Six pairs of accelerometers were circulated among 20 standards laboratories over a period of 5 years. The accelerometers were of the primary‐standard type, variously made in the U.S.A., Europe, and Japan. The purpose of this international round robin was to compare uncertainty statements of the participating laboratories with the spread in calibration results. The measurand in all cases was acceleration sensitivity of the specimen. The measurements selected for the present study had been performed in the frequency range 80–160 Hz under sinusoidal excitation of 1–100 m s−2. The sensitivity values reported by the calibration laboratories were analyzed by three graphical methods: the Youden plot, the box plot, and the stem‐and‐leaf plot. This communication describes the requirements of the test, explains the methods of analysis, and presents several statistically significant results. Some preliminary results were reported earlier [M. R. Serbyn, Proc. IEEE I&M Tech. Conf., 120–124 (1987)].
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
