Abstract
Ultrathin Ag films grown epitaxially on Pt(111) were studied by photoelectron forward scattering using synchrotron radiation. The complete angular distributions of the Ag 3d electrons at ∼ 500 eV kinetic energy were recorded in a cone with 88° opening angle using a two-dimensional display-type analyzer. The images reveal that the second Ag layer grows at room temperature predominantly in a hcp stacking sequence with respect to the pseudomorphic first Ag layer. After annealing to 750 K most of the second layer Ag atoms assume fcc sites. Further Ag layers continue to grow in a fcc stacking sequence relatïve to the first two Ag layers. Annealing does not change the stacking of thicker films. Thick fcc Ag films can be grown in a twin orientation with respect to the Pt(111) substrate at room temperature or in the substrate orientation if the second Ag layer is annealed.
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