Abstract
Crystallographic properties of Zr and ZIRLO™ in the temperature range of 30–1430 °C were investigated using in situ high-temperature X-ray diffraction (HT-XRD). Hexagonal Zr diffraction peaks observed at 30 °C started to vanish above 1110 °C for Zr and 1230 °C for ZIRLO™ owing to oxidation, resulting in a composition with monoclinic ZrO2, tetragonal ZrO2, and rhombohedral Zr3O. Furthermore, based on Pawley refinement of in situ HT-XRD spectra, we demonstrated that the lattice thermal expansion in ZIRLO™ occurred in a stable manner compared to that in Zr, which contribute to the enhancement of its mechanical properties via thermal treatment.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
