Abstract
Thin films of Fe have been epitaxially sputtered on GaAs substrates with native oxide removal prior to the deposition carried out by an Ar ion milling. Films grown at substrate temperatures above 100 °C show well-defined fourfold anisotropies. The onset of epitaxial growth is accompanied by an increase in the surface roughness with growth occurring in a distinct island-like pattern. The Fe layers show significantly reduced moments, which decrease with increasing temperature. Antiferromagnetic coupling between Fe layers with Cr spacers was measured in a multilayer with a Cr thickness of 2.7 nm, around the second antiferromagnetic peak. The magnetic properties of the films are discussed in the context of multilayer storage applications.
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