Abstract
Oxyfluoride glasses from the Na 2O–Al 2O 3–SiO 2–LaF 3 system were obtained as a potencial materials for optoelectronics. The effect of SiO 2 content on the tendency to the nanocrystallization of LaF 3 as well as the ceramization of the glassy matrix has been studied. Thermal stability of the glass and crystalline phases formed upon heat treatment were determined by DTA/DSC and XRD methods, respectively. The efect of the glass composition on the crystallizing phases was studied by MIR, FIR and Raman scattering methods. AFM method was used to confirm the structural analysis.
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