Abstract
The method of spectral Fourier microscopy was used to study the reflection spectra with an angular resolution of submicron periodic gratings based on amorphous and crystalline Ge2Sb2Te5. The form of the dispersion curves of quasi-waveguide modes in the structures under study was established. The experimental data were compared with the calculations of dispersion curves in synthesized diffraction gratings. Reasonable agreement between theoretical and experimental data was obtained.
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