Spectral dependence of the refractive index of chemical vapor deposition ZnSe grown on substrate with an optimized temperature increase

Abstract

Precise measurement of the refractive index of chemical vapor deposition (CVD) ZnSe with the Fourier-transform interference refractometry method from 0.9 to 21.7microm (from 11,000 to 460cm(-1)) with 0.1cm(-1) resolution is described. For this measurement, structurally homogeneous ZnSe plates were grown on a substrate with an optimized temperature increase. Using three ZnSe plates of different thicknesses, we managed to raise the measurement accuracy of the refractive index up to 2x10(-5) (being nearly 1 order of magnitude better than the available data) in the near IR and most of the middle IR wavelength range from 0.9 to 12.5microm (wavenumber range of 11,000-800cm(-1)) and up to 1...4x10(-4) in the 12.5-21.7microm (800-460cm(-1)) region. The experimental results are approximated by a generalized Cauchy dispersion function of the 8th power. Spectral wavelength dependencies of the first- and second-order derivatives of the refractive index are calculated, and the zero material dispersion wavelength is found to be lambda(0)=4.84microm.