Abstract
The low frequency electro-optic characteristics of cadmium zinc telluride are demonstrated in the mid-infrared, in the spectral range 2.5–11 μm. Conventional methods for characterizing the dynamic response by monitoring the amplitude of the time-varying light intensity do not account for spatial variation in material properties. In such cases, a more revealing method involves monitoring two distinct frequency components in order to characterize the dynamic and static contributions to the optical retardation. We demonstrate that, while this method works well for a ZnSe photo-elastic modulator, it does not fully capture the response of a cadmium zinc telluride electro-optic modulator. Ultimately, we show that acquiring the full waveform of the optical response enables a model to be created that accounts for inhomogeneity in the material that results in an asymmetric response with respect to the polarity of the driving voltage. This technique is applicable to broadband and fixed-wavelength applications in a variety of spectral ranges.
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