Abstract
The main aim of this work is a precise experimental assessment of the local stress fields developed at the notch-root in a ruby crystal, selected as a paradigm brittle material, by means of photo- and electron-stimulated luminescence techniques. Our approach takes advantage of the piezo-spectroscopic (PS) effect, which consists of a spectral shift of the luminescence emitted by the material due to lattice strain. Highly spatially resolved stress maps were extensively collected at the notch-root and spectral shifts monitored for the chromophoric (R-lines) fluorescence observed in a single-crystalline ruby sample. Experimental data were analyzed and compared to the theoretical solutions of notch-root stress fields given by Filippi and by Creager-Paris. Due to its inherent simplifications, the Creager–Paris solution was found leading to underestimation of the maximum stress value piled up in the material, while the Filippi’s solution represented a more suitable approximation for the stress field developed at the notch-root.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
