Abstract
Electron energy loss (EEL) spectroscopy and high angle annular dark field (HAADF) imaging in aberration-corrected electron microscopes are powerful techniques to determine the chemical composition and structure of materials at atomic resolution. We have implemented Smart Acquisition, a flexible system of scanning transmission electron microsocpy (STEM) beam position control and EELS collection, on two aberration-corrected dedicated cold field emission gun (FEG) STEMs located at SuperSTEM, Daresbury Laboratory. This allows the collection of EEL spectra from spatially defined areas with a much lower electron dose possible than existing techniques such as spectrum imaging.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
