Abstract
Between fault detection and diagnostic test, there are many tests with varying degrees of diagnosability. There is trade-off between diagnosability of the test and its length. High diagnosability test is longer and takes more time. In this work, we tried to balance both by generating test slightly longer than normal detection test but with high diagnosability, without affecting fault coverage. The order of test vector application to attain more fault and diagnostic coverage in fewer test patterns is also mentioned. If more diagnosability is required, test vectors till the lower order should be used, whereas shorter test compromises on diagnosability. Our results show similar distinguishing capability as compared with a recent work but with 90% reduction in normalized time. The fault model used in this work is stuck-at fault model.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
