Abstract

The fracture toughness of submicron Zr65Ni35 sputter-deposited films is thickness dependent. The failure mechanism involves corrugations for the thickest films and a transition—at 500 nm thickness—to a perfectly flat fracture surface. Bothmechanisms are brittle-type, even though the elastic and plastic properties are independent of thickness and similar to the expected ductile bulk response.Finite-element simulations unravel the origin of the size effect and the transition of failuremode fromthe constraint on plastic dissipation.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.