Abstract
A sinusoidal phase-modulating two-grating surface profile measuring instrument is reported. This instrument can precisely measure tiny rises and falls of the surface of an object. The (+1,0)th- and (0,+1)th-order beams diffracted from two identical binary step gratings produce a interference pattern with uniform intensity and phase distribution. When one grating is moved relative to the other, the phase of the interference pattern is changed. A sinusoidal phase-modulating technique is applied to measure this phase change precisely. The phase distribution of the interference pattern is independent of the wavelength and intensity of the light source. No change in the measurement results happens when the wavelength and intensity of the light source fluctuate. The instrument is simple in its optical configuration.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
