Abstract

A technique has been developed to measure the time‐resolved position of a laser‐driven shock wave and the subsequent material flow. Ultrafast dynamic ellipsometry, using a chirped femtosecond laser pulse, probes picosecond material dynamics in a single shot by capitalizing on the refractive index changes in the shocked material. For transparent materials, the shock velocity, the particle velocity, and the shocked material's refractive index are extracted. Hugoniot data for poly(chlorotrifluoroethylene‐co‐vinylidene fluoride) (Kel‐F 800) was obtained using ultrafast dynamic ellipsometry, and the data agrees well with previous data on macroscopic samples obtained in plate impact gas gun experiments.

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