Single event upset induced multi-block error and its mitigation strategy for SRAM-based FPGA

Abstract

According to the SRAM-based FPGA’s single event effect problem in space application, single event upset induced multi-block error (SEU-MBE) phenomenon and its mitigation strategy are studied in the paper. After analyzing the place and route result, the paper points out that the essence of SEU-MBE is that some important modules exceed the safe internal distance. Two approaches, area constraint method (ACM) and incremental route algorithm (IRA), are proposed, which can reduce the error rate by manipulating programmable switch matrix and interconnection points within FPGA route resource. Fault injection experiments indicate that error detection rate is above 98.6% for both strategies, and FPGA resources increment and performance penalty are around 10%.