Abstract
Our recently developed magnetic force microscopy for simultaneous imaging of perpendicular and in-plane magnetic field gradients was applied to polycrystalline La0.7Sr0.3MnO3 granular films with in-plane magnetization. The present method clearly imaged the gradient of the perpendicular and the in-plane magnetic field from the boundary phase, which behaved as a magnetic double layer with two separate planes of magnetic charges. Especially after magnetizing the film in one direction, the perpendicular and in-plane magnetic field gradients of a magnetic double layer with opposite-sign magnetic charges were clearly observed by this method. Calculated magnetic field gradients are consistent with those of the magnetic force microscopy images. The present method seems to be effective in evaluating the magnetic isolation between neighboring magnetic grains having the component of in-plane magnetization.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
