Abstract
The development of semiconductor detectors such as CdTe and CdZnTe which work at room temperature enables us to realize a new SPECT system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixelated detectors, and so the intrinsic resolution can be equal to the pixel size used for measurement. The size of a detector pixel is as small as 1 mm, so that the spatial resolution of a reconstructed SPECT image can establish less than 3mm FWHM. To clarify the feasibility of an ultra-high resolution SPECT system, we conducted some simulations and evaluated the image quality.
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