Abstract
X-ray phase contrast image has higher sensitivity to materials with light elements than the conventional absorption contrast. Phase image measurement technique using diffraction gratings can be used in the laboratory. Furthermore, X-ray phase microscope using the diffraction gratings has been also developed. However, phase measurement with diffraction gratings has a drawback that the spatial resolution is limited to the grating period. To overcome this problem, a scanning system using a triangular phase grating has recently been proposed, which is expected to archive a large field of view and a high spatial resolution. This study aims to investigate the feasibility of the system and a deep understanding of the optical system by simulation.
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