Abstract
We present a novel design of multi-color (405 nm, 532 nm and 780 nm) illuminated silicon nitride (Si3N4) waveguide platform for two-dimensional label-free super-resolution imaging based on frequency shifting and Gerchberg–Saxton algorithm reconstruction. We simulated the light propagating process and imaging process, indicating the capability of super-resolution imaging with high signal-to-noise ratio by mode control in the waveguide. Dispersion of the sample was also analysed for multi-wavelength illumination. The Si3N4 waveguide platform provides a convenient and high-quality illumination approach for frequency-shift-based super-resolution imaging.
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