Abstract
A reduced physical model of the integral non-linearity error in high resolution R-2R D/A converters is obtained by circuit analysis and application of the ambiguity algorithm. Its relationships with the well establisheda priori model based on Rademacher functions is discussed. Experiments, carried out on a sample of commercial 12 bit converters, demonstrate that functional test programs based on this model achieve shorter test times and lower prediction errors than those based on larger models obtained by straight QR factorization.
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