Abstract
ABSTRACTFree-standing shape memory thin films of the system Ti-Ni-Pd-Cu exhibiting the two-way-effect have been fabricated by d.c. magnetron sputtering onto unheated substrates followed by annealing and training processes. Their transformation temperatures were investigated by differential scanning calorimetry and electrical resistivity measurements. By the Ni-Pd substitution the transformation temperatures (austenite/martinsite finish temperature; Af/Mf) could be varied between 32°C/-38°C for the binary TiNi films to 570°C/498°C for the binary TiPd films. By the Ni-Cu substitution the transformation hysteresis (Af/Mf) could be reduced from 70°C for the binary film to 20°C for films with 10 at % Cu. A similar behavior was observed for TiNiPdCu films.
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