Abstract
Capping of self-assembled semiconductor quantum dots usually alters their shape and composition due to alloying with the matrix material. To determine the structure of capped dots, a method is developed based on the analysis of surface displacements induced by buried dots measured by scanning tunneling microscopy. For self-assembled PbSe dots overgrown with PbTe layers, the buried dots are found to be highly truncated and extended in the lateral direction, and due to intermixing their composition is changed to PbSexTe1−x, with xSe of only 55%.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
