Abstract

Thin film lithium niobate (TFLN) features a small photonic device footprint and excellent optical properties. Despite the recent progress on plasma-etched TFLN waveguides, scattering loss induced by the sidewall roughness still limits the performance of the integrated photonic devices. Here, a shallow-etched structure that can mitigate the scattering loss along the waveguide sidewall is proposed and investigated, while the consequent coupling to the continuous slab mode can be easily eliminated by properly adjusting the waveguide width, achieving a low-loss bound state in the continuum. Our proposed scheme would facilitate low-loss and high performance TFLN photonic devices in the future.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.