Abstract
The self-assembly of hexagonal optical patterns in ferroelectrics such as lead magnesium niobate (PMN) or potassium niobate (KNbO3) occurs due to simultaneous photorefractive processes, which involve the accidental writing of holographic gratings of charge defect waves (Λ ≈ 3.5 μ), and thermal focussing (or defocussing). The present paper shows how this novel effect can be used to characterise ferroelectric materials for memory application, particularly with respect to fatigue mechanisms.
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