Abstract
A mass spectrometer ion collector system has been devised for the investigation of secondary electron emission by impact of ions on surfaces. Results are reported for various ions incident on clean, baked (but not atomically clean) surfaces of AgMg, CuBe, and Nichrome V targets. For rare gas isotopic ions it is found that for a given energy ion the value of γ varies approximately inversely with the square root of the mass.
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