Abstract
We describe spectromicroscopy experiments at the X1A facility at the National Synchrotron Light Source. In these efforts, two scanning x-ray microscopes based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years and recently completed the first tests. We will describe its performance and outline further improvements. STXM has been utilized to provide chemical contrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.
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