Abstract

The purpose of this chapter is to give a brief introduction to scanning probe microscopy (SPM) technique, discuss recent developments, and to guide the reader through a variety of recent results presented in this volume. Various SPM techniques including contact, dynamic, force modulation, friction, chemical, electrostatic, adhesion, and thermal modes applied to probing of polymer surfaces are discussed. Current trends are summarized including quantitative SPM measurements, probing of nanoscale mechanical properties, studying dynamical surface properties, and exploring local chemical sensing. Table of contents Introduction Basic Principles Basic modes of operation Contact mode and intermittent contact mode Friction force mode Force displacement measurements Dynamic force displacement Force modulation Chemical sensing Other SPM scanning modes (electrostatic, magnetic, and thermal) Static probing of local micromechanical properties Basics of dynamic force approach Artifacts in scanning and force modulation measurements Limits on Spatial Resolution SPM Applications in Polymers References

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