Abstract

AbstractKnowledge of physical properties of cells is vital for many research areas in biology and medicine. Atomic force microscopy (AFM) and scanning ion conductance microscopy (SICM) are two techniques to assess the three-dimensional topography and mechanical properties of cells. This chapter introduces the basic working principles and imaging modes of AFM and SICM and then focuses on their similarities and differences. Strengths and limitations in terms of image resolution, imaging speed, and biomechanical applications are discussed. Also, combined applications of SICM and AFM are highlighted. This chapter shows that SICM has emerged as a major addition to the field of biophysics.KeywordsAFMBiomechanicsCell morphologyHigh-speed imagingResolutionSICM

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call