Abstract
Microscopic in situ observations of diamond growth have not yet been accomplished owing to the difficulties arising from the usual CVD conditions, in particular from a substrate temperature in the range of 850–950 °C and a gas pressure of about 40 mbar. In addition, either the hot filament or the microwave plasma gives rise to further complications. In our experiments, we use a modified scanning laser microscope for bright-field and also for the first time for dark-field observations. It consists of a linearly polarized argon laser beam (wavelength, 488 nm) that passes through a spatial filter having a pinhole of only 1 μm diameter. With a suitable Schwarzschild reflecting objective the image of the pinhole occurs at unit magnification at an extremely large working distance of 24 mm in front of the objective, where the growing diamond surface has to be placed. A raster scan of the laser focus across the diamond surface can be achieved by moving either the objective or the sample by means of two crossed piezoceramic translators.
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