Abstract
We have proposed and demonstrated a novel method for fast imaging in intermittent contact mode atomic force microscopy (AFM) using a sample-and-hold circuit for direct monitoring of cantilever deflection signals. This method enables us to construct a quasi-topographic image from tip heights at moments when the tip taps on a sample surface. As a result, we obtained the tip height image well corresponding to the sample topography at a scanning rate above 30 Hz/line without any other customization on both a cantilever and a piezo scanner in a commercial AFM system.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
