Abstract
AbstractNowadays, thin‐film transistor liquid crystal displays (TFT‐LCDs) have realized high reliability of display characteristics by improving liquid crystal (LC) materials and cell fabrication processes. In order to improve display reliability, measurement methodologies are important to see the progress of improvement of materials and processes; thus, our group has proposed voltage holding ratio (VHR), ion impurity, residual direct current (DC) and elastic constants for LC cells, and the optical anisotropy of an alignment layer on indium tin oxide (ITO) glass substrate for LCD industry. In case of an ion impurity, we have succeeded in measuring the ion impurity amount in TFT‐LCD. Furthermore, we have recently proposed ion impurity measurement methodology for beyond LCD applications that are organic light emitting diode (OLED) and organic photovoltaics (OPV).In this review, I introduce each measurement methodology for LCDs and beyond LCDs in detail.
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