Revealing two-dimensional electric field crowding effect in breakdown performance of DPPT-TT polymer-based OFETs

Abstract

The diketopyrrolopyrrole-based polymer (DPPT-TT) has been employed in organic power field effect transistors due to its exceptional off-state breakdown performance. The impact of organic semiconductor layer thickness on the breakdown performance has not been explored. In this study, we investigate the impact of DPPT-TT layer thickness on the breakdown voltage (BV) by fabricating organic field effect transistors (OFETs) with various DPPT-TT layer thicknesses. Our findings reveal that the devices' BV is a strong function of DPPT-TT layer thickness, and reducing the DPPT-TT layer thickness from 68 to 15 nm results in a decrease in BV from 291 to 86 V, attributed to the two-dimensional (2D) electric field crowding effect. An analytical model utilizing the 2D Poisson equation reveals an electric field at the DPPT-TT layer's surface. Thinner DPPT-TT layer exhibits larger electric field peak, leading to premature breakdown near the drain electrode. The relationship between breakdown electric field and DPPT-TT layer thickness was established by fitting the experimental data to the model, revealing an average BV error of only 8.8%. This phenomenon is validated to be ubiquitous in polymer based OFETs via DPPT-TT-based and P3HT-based devices. According to the proposed model, this 2D electric field crowding effect can be mitigated by adjusting the dielectric layer thickness (tD) and/or the dielectric material.