Abstract
Combining an extended Julliere model with transfer matrix method, we study the spin-polarized resonant tunneling in GaMnAs/AlAs/GaAs/AlAs/GaMnAs double barrier ferromagnetic semiconductor (FS) tunnel junctions with the arbitrary angle θ between the magnetic directions of two FS's. It is shown that tunneling magnetoresistance (TMR) ratio linearly varies with sin2(θ/2). We also demonstrate that for the heavy and light holes, the properties of the spin-polarized resonant tunneling are obviously different. The present results are expected to be instructive for manufacturing the relevant semiconductor spintronic devices.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
