Abstract

Nanoscale material systems are central to next-generation optoelectronic and quantum technologies, yet their development remains hindered by limited characterization tools, particularly at terahertz (THz) frequencies. Far-field THz spectroscopy techniques lack the sensitivity for investigating individual nanoscale systems, whereas in near-field THz nanoscopy, surface states, disorder, and sample-tip interactions often mask the response of the entire nanoscale system. Here, we present a THz resonance-amplified near-field spectroscopy technique that can detect subtle conductivity changes in isolated nanoscale systems─such as a single InAs nanowire─under ultrafast photoexcitation. By exploiting the spatial localization and resonant field enhancement in the gap of a bowtie antenna, our approach enables precise measurements of the nanostructures through shifts in the antenna resonant frequency, offering a direct means of extracting the system response, and unlocking investigations of ultrafast charge-carrier dynamics in isolated nanoscale and microscale systems.

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