Abstract
Lima bean, Phaseolus lunatus L., lines resistant to Empoasca kraemeri Ross and Moore were identified by a visual rating system in Palmira, Colombia. Resistance levels were superior to those in common beans. Nymphal populations were highly and positively correlated with insect damage. Trichome density on the leaf undersides was highly and negatively correlated with damage. Reciprocal crosses were made between a resistant and a susceptible line. Continuous segregation for reaction to leafhoppers was observed in F2 plants, indicating quantitative inheritance of the trait in lima beans with dominance of the susceptible reaction. The low trichome density trait was dominant. Regression of parental and progeny damage on trichome density revealed a highly negative correlation, confirming the important role of trichomes in leafhopper resistance.
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