Abstract
Recently, the ‘stress scanning method’ has been introduced in the field of depth resolved residual stress analysis. The principle of this method is based on depth scans that are performed in several inclination angles with a gauge volume characterized by a height dimension in the range of 10 µm. This method has been used in the energy-dispersive mode of diffraction for rather long-range depth gradients. In this case the variation of the residual stresses is negligible on the scale of the gauge volume height dimension. In this contribution it is shown that the stress scanning method can be extended to the analysis of steep residual stress depth gradients that vary significantly even within the height dimension of the gauge volume, but a careful evaluation of the measured data is necessary and must be adapted to the special case.
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