Abstract
Since the advent of computer techniques used to simulate contrast images of crystal defects, increasing attention has been placed on the interpretation of the fine detail of individual defect images. One fruitful area for computer simulation methods concerns the explanation of residual fringe patterns of stacking faults for two beam conditions in the electron microscope, where g.R = 0,1,2…For this condition, a single stacking fault should be completely invisible, and the presence of residual fringes implies that R is not exactly equal to a perfect lattice vector. Such a modification of R could come about from the strain field resulting from heterogeneous precipitation at the fault plane. Residual fringes have also been produced when either a total or partial dislocation passes through an ordered lattice in Cu-Al alloys.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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